The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Nov. 19, 2007
Chi Yoon Jeong, Daejeon, KR;
Beom Hwan Chang, Daejeon, KR;
Seon Gyoung Sohn, Daejeon, KR;
Geon Lyang Kim, Daejeon, KR;
Jong Hyun Kim, Daejeon, KR;
Jong Ho Ryu, Cheonan, KR;
Jung Chan NA, Daejeon, KR;
Jong Soo Jang, Daejeon, KR;
Sung Won Sohn, Daejeon, KR;
Chi Yoon Jeong, Daejeon, KR;
Beom Hwan Chang, Daejeon, KR;
Seon Gyoung Sohn, Daejeon, KR;
Geon Lyang Kim, Daejeon, KR;
Jong Hyun Kim, Daejeon, KR;
Jong Ho Ryu, Cheonan, KR;
Jung Chan Na, Daejeon, KR;
Jong Soo Jang, Daejeon, KR;
Sung Won Sohn, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
There are provided an apparatus and method for sampling a security event based on contents of the security event, the apparatus including: a security event accumulation module collecting security events occurring in a network system and storing the security events for each type according to contents of the security event; a security event analysis module calculating distribution of the security events for each type by analyzing the stored security events; and a security event extraction module sampling the stored security events according to the calculated distribution of the security events for each type. The apparatus and method may improve speed of visualization of a security event and a security event analysis apparatus and may increase accuracy thereof.