The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Apr. 30, 2007
Applicants:

Naoki Abe, Rye, NY (US);

David L. Jensen, Peekskill, NY (US);

Srujana Merugu, Sunnyvale, CA (US);

Justin Wai-chow Wong, South Burlington, VT (US);

Inventors:

Naoki Abe, Rye, NY (US);

David L. Jensen, Peekskill, NY (US);

Srujana Merugu, Sunnyvale, CA (US);

Justin Wai-Chow Wong, South Burlington, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method (and system) for causal modeling includes modeling a data set. The modeling includes estimating a reverse Bayesian forest for the data set and detecting outliers in a separate data set. Detecting the outliers includes applying the reverse Bayesian forest to the separate data set to obtain a probability value assigned to data points in the separate data set and identifying outliers in the separate data set by evaluating the probability value given by the reverse Bayesian forest.


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