The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Mar. 12, 2008
Applicants:

Peter N. Francino, Renfrew, PA (US);

Xu Cheng, Pittsburgh, PA (US);

Frederick C. Huff, Pittsburgh, PA (US);

Inventors:

Peter N. Francino, Renfrew, PA (US);

Xu Cheng, Pittsburgh, PA (US);

Frederick C. Huff, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A statistical performance evaluation system for a thermodynamic device and process uses the achievable performance derived from statistics and real-time data for the device or process to evaluate the current performance of the device or process, and to adjust the operations of the device or process accordingly, or provide feedback to an operator or other monitoring system for taking corrective actions to obtain performance approaching the optimum achievable performance. The achievable performance of the device or process is derived from data collected during operational periods when the best achievable performance is anticipated, such as after maintenance is performed, and supersedes the ideal or design performance specified by the manufacturer, which typically does not represent the actual operating conditions in the field, as the basis for evaluating the real-time performance of the device. The statistical performance evaluation system may set desired upper and lower limits for performance parameters, and compare desired limits to the actual performance parameter values to determine the readjustment to be made to the operation of the device or process.


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