The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Jun. 04, 2009
Applicants:

Yonpyo Hon, Yamanashi, JP;

Kenzo Ebihara, Yamanashi, JP;

Akira Yamamoto, Yamanashi, JP;

Masayuki Hamura, Yamanashi, JP;

Inventors:

Yonpyo Hon, Yamanashi, JP;

Kenzo Ebihara, Yamanashi, JP;

Akira Yamamoto, Yamanashi, JP;

Masayuki Hamura, Yamanashi, JP;

Assignee:

Fanuc Ltd, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.


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