The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Jun. 12, 2008
Applicants:

Abhishek Lall, Manhattan, KS (US);

Ashish Bhan, Shawnee, KS (US);

Sachin Vargantwar, Overland Park, KS (US);

Robert Stedman, Raymore, MO (US);

Mark Yarkosky, Overland Park, KS (US);

Inventors:

Abhishek Lall, Manhattan, KS (US);

Ashish Bhan, Shawnee, KS (US);

Sachin Vargantwar, Overland Park, KS (US);

Robert Stedman, Raymore, MO (US);

Mark Yarkosky, Overland Park, KS (US);

Assignee:

Sprint Spectrum L.P., Overland Park, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04B 17/00 (2006.01); G10L 21/02 (2006.01); G10L 11/00 (2006.01); H04M 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method and system for defining the mean opinion score (MOS) as a function of frame error rate (FER) and pilot signal strength. In an embodiment of the invention, an entity receives MOS scores that have been obtained using subjective tests for certain calls made within the network. Next, the entity receives FER and pilot signal strength samples that have been obtained for the calls for which MOS scores have been subjectively obtained. Finally, the entity calculates an equation for the MOS as a function of FER and pilot signal strength using a non-linear regression analysis.


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