The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Dec. 14, 2006
Applicants:

Roland Brandl, Eggersdorf bei Graz, AT;

Ewald Bergler, Weiz, AT;

Robert Spindler, Graz, AT;

Inventors:

Roland Brandl, Eggersdorf bei Graz, AT;

Ewald Bergler, Weiz, AT;

Robert Spindler, Graz, AT;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/00 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit () comprises a first circuit point () and a second circuit point (), which first circuit point () and second circuit point () are designed to be connected with RF transmission means () being designed for receiving in a contact-less manner a carrier signal (CS) from a read/write station and for feeding the circuit () with the received carrier signal (CS). The circuit () further comprises circuit testing means () being designed to carry out functional tests of the circuit () and to output a modulated response signal (TS-MOD) via the first and second circuit points () only if the functional tests have been successful. The circuit () further comprises test trigger signal detecting means () being designed for detecting a test trigger signal (TS) that is applied across the first circuit point () and the second circuit point (), wherein the test trigger signal detecting means () are designed to trigger the circuit testing means () to carry out the functional tests if they detect the test trigger signal (TS).


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