The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Jul. 12, 2005
Applicants:

Luca Blessent, San Marcos, CA (US);

Jiangxin Chen, San Diego, CA (US);

Farrokh Abrishamkar, San Diego, CA (US);

Inventors:

Luca Blessent, San Marcos, CA (US);

Jiangxin Chen, San Diego, CA (US);

Farrokh Abrishamkar, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 7/185 (2006.01); H04B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for measuring a rise-over-thermal (RoT) characteristic in a communication network includes controlling a transmitting station to maintain its transmit power at a substantially constant level for a first time interval, and measuring a first received power level. The transmitting station is then controlled to adjust its transmit power by a selectable amount for a second time interval, and a second received power level is measured. The first and second received power levels are then processed to determine the RoT characteristic.


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