The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

May. 27, 2009
Applicant:

Nobuhiko Maiya, Yokohama, JP;

Inventor:

Nobuhiko Maiya, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided with a time-lapse imaging unit which repeatedly captures a specimen at predetermined time intervals and generates a plurality of images, and a recording unit which records at least one of an image group including one or more of the images captured during a predetermined period among a period of a time-lapse capturing performed by the time-lapse imaging unit or an image group including one or more of the images picked at predetermined time intervals among the period of the time-lapse capturing performed by the time-lapse imaging unit. Thus, data generated in time-lapse photography are managed favorably in a microscope apparatus provided with a time-lapse imaging unit which repeatedly captures a specimen at predetermined time intervals and generates a plurality of images.


Find Patent Forward Citations

Maiya, Nobuhiko. (2012). Microscope apparatus (U.S. Patent No. 8139106). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8139106

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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