The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Jan. 29, 2010
Fa Foster Dai, Auburn, AL (US);
Jianjun Yu, Auburn, AL (US);
Fa Foster Dai, Auburn, AL (US);
Jianjun Yu, Auburn, AL (US);
Auburn University, Auburn, AL (US);
Abstract
A time to digital converter (TDC) is able to be utilized for measuring a time interval between two signals with a very fine time resolution, which is defined as the difference in propagation delay per stage between two rings or chains of delay stages. The Vernier ring TDC, Vernier TDC with comparator matrix or Vernier ring TDCs with comparator matrix comprise two rings or chains of delay stages with slightly different propagation delays per stage and a plurality of comparators for comparing two signals propagation along two rings or chains and determining when the lag signal passes the lead signal. The lead and lag signal are initiated by two events and are each fed into a separate one the first stages of one of the specified rings or chains. The comparators are able to be organized in a comparator matrix in order to occupy less space and permit reuse. As a result, the input time interval (the time between the two initiating events) is able to be measured through the product of the time resolution and the number of stages through which the two signals propagated.