The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Sep. 04, 2007
Josep Rius Vazquez, Barcelona, ES;
Luis Elvira Villagra, Eindhoven, NL;
Rinze I. M. P. Meijer, Herkenbosch, NL;
Josep Rius Vazquez, Barcelona, ES;
Luis Elvira Villagra, Eindhoven, NL;
Rinze I. M. P. Meijer, Herkenbosch, NL;
NXP B.V., Eindhoven, NL;
Abstract
A circuit portion () of an IC comprises a plurality of conductive tracks () for coupling respective circuit portion elements (), e.g. standard logic cells, to a power supply rail (), with the conductive tracks () being coupled to the power supply rail () via at least one enable switch (). The circuit portion () further comprising an element () for determining a voltage gradient over the circuit portion () in a test mode of the integrated circuit (), which is conductively coupled to the conductive tracks (). The element () has a first end portion () for coupling the element () to the power supply terminal and a second end portion () for coupling the element () to the output () in the test mode. This facilitates IDDQ testing of the circuit portion () by means of measuring a voltage gradient over the element ().