The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Apr. 09, 2008
Rudolph Maria Snoeren, Veldhoven, NL;
Heidrun Steinhauser, Eindhoven, NL;
Nicolaas Jan Noordhoek, Breda, NL;
Matthias Simon, Aachen, DE;
Rudolph Maria Snoeren, Veldhoven, NL;
Heidrun Steinhauser, Eindhoven, NL;
Nicolaas Jan Noordhoek, Breda, NL;
Matthias Simon, Aachen, DE;
Koninklijke Philips Electronics NV, Eindhoven, NL;
Abstract
A method for providing information about a spatial gain distribution of a scintillator for a primary radiation is provided which does not require the irradiation of the scintillator with the primary radiation. The method comprises the step of irradiating the scintillator with a secondary radiation for generating an image of a spatial secondary gain distribution of the scintillator for said second radiation. The spatial secondary gain distribution image corresponds to an image of the spatial primary gain distribution for the primary radiation. In an embodiment of the invention, i.e. in an X-ray imaging device where the primary radiation is X-ray radiation, the invention provides for an accurate calibration of the X-ray detector without irradiating the X-ray detector with X-ray radiation. Rather, irradiation with UV radiation as the secondary radiation provides the desired spatial secondary gain distribution image which can be used for calibration.