The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Nov. 03, 2009
Kenji Maeda, Isehara, JP;
Kenji Maeda, Isehara, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An eccentricity measurement method of measuring the eccentricity of a rotary disk of a rotary encoder includes forming, on the rotary disk, at least one first straight-line pattern group in a different radial direction including a plurality of straight-line patterns that are equally spaced in the radial direction and extend in a normal line direction from a base point a predetermined distance away from a center of a radial scale of the rotary disk; placing the rotary disk on a table including at least one second straight-line pattern group including straight-line patterns; and measuring the amount and the direction of the eccentricity of the rotary disk in accordance with the position of the straight-line pattern of the first straight-line pattern group that coincides with the position of the straight line pattern of the second straight-line pattern group in the radial direction.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile