The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Mar. 20, 2009
Andrew S. Yeh, Portland, OR (US);
Cary Eric Sjolander, Tigard, OR (US);
Andrew S. Yeh, Portland, OR (US);
Cary Eric Sjolander, Tigard, OR (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A system evaluates image quality in an image generating system in the presence of digital image noise and/or missing jets. The system includes a test pattern generator configured to generate a test pattern on an image substrate, an image capture device configured to generate a digital image of the generated test pattern on the image substrate, an image evaluator configured to process the digital image and generate a solution for an over-determined matrix of equations formed from differential distance measurements obtained with reference to a jet in the digital image by minimizing the root-mean-square (RMS) of residual errors corresponding to the matrix, and a controller configured to generate a correction parameter from the generated solution and to apply the correction parameter to the jet used for the used for the differential distance measurements.