The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Jun. 07, 2006
Pasqual Batalla, Sant Cugat del Valles, ES;
Jordi Sender, Sant Cugat del Valles, ES;
Marc Bautista, Sant Cugat del Valles, ES;
Toni Gracia, Sant Cugat del Valles, ES;
Angel Alvarez, Sant Cugat del Valles, ES;
Jean Frederic Plante, Sant Cugat del Valles, ES;
Alex Andrea, Sant Cugat del Valles, ES;
Pascal Ruiz, Sant Cugat del Valles, ES;
Joan Campderros, Sant Cugat del Valles, ES;
Angel Martinez Barambio, Sant Cugat del Valles, ES;
Alejandro Campillo, Sant Cugat del Valles, ES;
Marcos Casaldaliga, Sant Cugat del Valles, ES;
Pasqual Batalla, Sant Cugat del Valles, ES;
Jordi Sender, Sant Cugat del Valles, ES;
Marc Bautista, Sant Cugat del Valles, ES;
Toni Gracia, Sant Cugat del Valles, ES;
Angel Alvarez, Sant Cugat del Valles, ES;
Jean Frederic Plante, Sant Cugat del Valles, ES;
Alex Andrea, Sant Cugat del Valles, ES;
Pascal Ruiz, Sant Cugat del Valles, ES;
Joan Campderros, Sant Cugat del Valles, ES;
Angel Martinez Barambio, Sant Cugat del Valles, ES;
Alejandro Campillo, Sant Cugat del Valles, ES;
Marcos Casaldaliga, Sant Cugat del Valles, ES;
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
The invention relates to a calibration method for a printer having a mechanism for advancing a medium in a direction of media advance comprising the following steps: (a) providing a printhead, the printhead having a swath height in the direction of media advance; (b) providing an estimate of either the swath height or the characteristic of the mechanism; (c) printing a base pattern on a medium using the printhead; (d) printing an overlay pattern on the medium using the printhead to form an interference pattern; (e) advance the medium of a predetermined distance using the mechanism at a time between the printing of the base pattern and the printing of the overlay pattern; (f) analyze an optical evaluation of the interference pattern; (g) evaluate as either: (i) the swath height if the characteristic of the mechanism is known or estimated; or (ii) the characteristic of the mechanism if the swath height is known or estimated.