The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Apr. 14, 2009
Applicants:

Lewis William Dewey, Iii, Wappingers Fall, NY (US);

Ibrahim M. Elfadel, Cortlandt Manor, NY (US);

David J. Widiger, Pflugerville, TX (US);

Inventors:

Lewis William Dewey, III, Wappingers Fall, NY (US);

Ibrahim M. Elfadel, Cortlandt Manor, NY (US);

David J. Widiger, Pflugerville, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The Width Bias Calculator (WBC) calculates electrical values by effectively averaging the electrical values to either side of a target wire shape whereby values are approximated for design validation without a significant impact on performance or memory consumption.


Find Patent Forward Citations

Dewey, III, Lewis. (2012). Accurate approximation of resistance in a wire with irregular biasing and determination of interconnect capacitances in vlsi layouts in the presence of catastrophic optical proximity correction (U.S. Patent No. 8136069). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8136069

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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