The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2012
Filed:
Dec. 01, 2008
Jeanne Paulette Spence Bickford, Essex Junction, VT (US);
Jason D. Hibbeler, Williston, VT (US);
Juergen Koehl, Weil Schoenbuch, DE;
William John Livingstone, Unerhill, VT (US);
Daniel Nelson Maynard, Craftsbury Common, VT (US);
Jeanne Paulette Spence Bickford, Essex Junction, VT (US);
Jason D. Hibbeler, Williston, VT (US);
Juergen Koehl, Weil Schoenbuch, DE;
William John Livingstone, Unerhill, VT (US);
Daniel Nelson Maynard, Craftsbury Common, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus, system, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired opens.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile