The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Aug. 06, 2007
Applicants:

Vanko Vankov, San Francisco, CA (US);

Vinod Jeyachandran, Rockville, MD (US);

Pradeep K. Singh, Arlington, VA (US);

Alain J. Cohen, McLean, VA (US);

Shobana Narayanaswamy, Kensington, MD (US);

Inventors:

Vanko Vankov, San Francisco, CA (US);

Vinod Jeyachandran, Rockville, MD (US);

Pradeep K. Singh, Arlington, VA (US);

Alain J. Cohen, McLean, VA (US);

Shobana Narayanaswamy, Kensington, MD (US);

Assignee:

OPNET Technologies, Inc., Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Network survivability is quantified in such a way that failure cases can be compared and ranked against each other in terms of the severity of their impact on the various performance measures associated with the network. The degradation in network performance caused by each failure is quantified based on user-defined sets of thresholds of degradation severity for each performance measure. Each failure is simulated using a model of the network, and a degradation vector is determined for each simulated failure. A comparison function is defined to map the degradation vectors into an ordered set, and this ordered set is used to create an ordered list of network failures, in order of the network degradation caused by each failure.


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