The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Mar. 20, 2007
Applicants:

Michael John Haertel, Portland, OR (US);

R. Stephen Polzin, San Jose, CA (US);

Andrej Kocev, York, ME (US);

Maurice Bennet Steinman, Marlborough, MA (US);

Inventors:

Michael John Haertel, Portland, OR (US);

R. Stephen Polzin, San Jose, CA (US);

Andrej Kocev, York, ME (US);

Maurice Bennet Steinman, Marlborough, MA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/10 (2006.01); G06F 11/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for implementation of error correction code (ECC) checking in non-ECC-compliant components. The method includes receiving a logical address, wherein the logical address maps to first and second physical addresses of a memory. The first and second physical addresses of the memory correspond to memory locations that store data and a corresponding ECC, respectively. The method further comprises translating the logical address into the first and second physical addresses, accessing the data over a data path, separately accessing the ECC over the same data path, and checking the integrity of the data using the ECC.


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