The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Jul. 09, 2008
Applicants:

Francis A. Kampf, Jeffersonville, VT (US);

Jeanne Trinko-mechler, Essex Junction, VT (US);

David R. Stauffer, Essex Junction, VT (US);

Inventors:

Francis A. Kampf, Jeffersonville, VT (US);

Jeanne Trinko-Mechler, Essex Junction, VT (US);

David R. Stauffer, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are adaptable to arbitrary configurations of the datapath system. The database is provided with a single set of transactors per core. Next, the method automatically selects one set of transactors from the database for inclusion into the simulation testbenches. Following this, the method maps the first datapath and the second datapath through the datapath system by interconnecting the selected set of the transactors with the datapath system. The method further comprises setting control pins on the cores to facilitate propagation of the data through the cores of the datapath system. Subsequently, the control pins are traced to input ports and control registers.


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