The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Jun. 02, 2009
Applicants:

Mark Duron, East Patchogue, NY (US);

Sean Connolly, Stony Brook, NY (US);

Martin Strzelczyk, New Market, MD (US);

Inventors:

Mark Duron, East Patchogue, NY (US);

Sean Connolly, Stony Brook, NY (US);

Martin Strzelczyk, New Market, MD (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); H04B 1/06 (2006.01); H04Q 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are methods, devices and systems for characterizing an attached antenna to an electronic device, such as a radio frequency identification ('RFID') reader. One exemplary embodiment is related to a method comprising outputting a low amplitude modulation ('AM') index radio frequency (“RF”) waveform, the waveform simulating tag data timing and bandwidth, removing a direct current (“DC”) component from the waveform to create a chopped portion of the waveform, applying at least one vector analyzer technique on the chopped portion of the waveform, characterizing at least one antenna impedance vector of the waveform.


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