The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Jun. 30, 2009
Applicant:

Yu Kuang, Hsinchu, TW;

Inventor:

Yu Kuang, Hsinchu, TW;

Assignee:

Raydium Semiconductor Corporation, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an evaluation method, voltages at ends of a to-be-measured capacitor and a capacitance-adjustable circuit are switched in response to a first set of clock signals so as to adjust an integrated voltage to be a sum of the integrated voltage and a first difference voltage. Next, whether a first control event is received is judged. If not, the previous step is performed. If yes, an integration operation is performed to switch a voltage of an end of a known capacitor in order to adjust the integrated voltage to be a sum of the integrated voltage and a second difference voltage. Next, whether an integrating period ends is judged. If not, the first step is repeated. If yes, a capacitance of the to-be-measured capacitor is obtained according to the number of times that the integration operation is performed in the integrating period and a capacitance of the known capacitor.


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