The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2012
Filed:
Nov. 05, 2007
Holger Timinger, Hamburg, DE;
Johannes Adrianus Overweg, Uelzen, DE;
Holger Timinger, Hamburg, DE;
Johannes Adrianus Overweg, Uelzen, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The present invention relates to a magnetic resonance examination system () and to a method of operating such a magnetic resonance examination system (). In particular the present invention relates to a magnetic resonance examination system () comprising a superconducting main magnet () surrounding an examination region () and generating a main magnetic field in the examination region (), and further comprising a magnetic field gradient system () selectively causing alternating gradient magnetic fields in the examination region (), said magnetic field gradient system () being coupled to the main magnet (). In order to provide a technique to reliably detect a quench of the superconducting main magnet () of such a magnetic resonance examination system () a detecting device () is suggested for detecting an emerging quench of the main magnet (), said detecting device () being adapted to operate in different modes depending on the mode of operation of the magnetic resonance examination system (e.g. ramp-up, ramp-down or continuous operation).