The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2012
Filed:
Jul. 21, 2008
Nathan E. Yanasak, Crawfordville, GA (US);
Tom C. HU, Evans, GA (US);
Nathan E. Yanasak, Crawfordville, GA (US);
Tom C. Hu, Evans, GA (US);
Medical College of Georgia Research Institute, Inc., Augusta, GA (US);
Abstract
A test object for use with diffusion MRI and a system and methods of synthesizing complex diffusive geometries. The test object, which includes anisotropic structures, can be used to monitor DTI measures by providing a baseline measurement. Using measurements of the phantom, data characteristic of more complicated diffusive behavior can be 'synthesized', or composed of actual measurements re-arranged into a desired spatial distribution function describing diffusion. Unlike a typical DTI scan, the ADC measurements of the present invention are treated in a 'reconstruction' phase as if the gradients were applied in different directions. Given a set of reconstruction directions, a judicious choice of acquisition directions for each reconstruction direction allows for the synthesis of any distribution.