The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Dec. 15, 2006
Applicant:

Akito Hirano, Toyama, JP;

Inventor:

Akito Hirano, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/31 (2006.01);
U.S. Cl.
CPC ...
Abstract

Substrate contamination from tungsten is prevented. A substrate processing method comprises a main treatment process for oxidizing a substrate containing tungsten with a gas containing oxygen, and a cleaning process for removing tungsten oxides with a gas containing hydrogen. The main treatment process includes loading the substrate containing metal into the processing chamber; supplying gas containing oxygen into the processing chamber; and supplying electric power to a high-frequency electric power supply to generate plasma containing oxygen elements, stopping the supply of electric power, and unloading the substrate from the processing chamber. The cleaning process includes supplying gas containing hydrogen into the processing chamber after unloading the substrate; supplying electric power to a high-frequency electric power supply to generate plasma containing hydrogen elements; and stopping the supply of electric power.


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