The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2012
Filed:
Jun. 19, 2008
Sergey M. Shevchenko, Aurora, IL (US);
Michael J Murcia, DeKalb, IL (US);
Patrick J. Macuch, Naperville, IL (US);
Sergey M. Shevchenko, Aurora, IL (US);
Michael J Murcia, DeKalb, IL (US);
Patrick J. Macuch, Naperville, IL (US);
Nalco Company, Naperville, IL (US);
Abstract
A method for monitoring one or more deposits including microbiological deposits on a surface immersed in an aqueous medium of a process is disclosed. The method comprises: (a) providing a QCM that is in contact with an aqueous medium, wherein said QCM has a top side surface contacting the aqueous medium, and a second, bottom side surface isolated from the aqueous medium; (b) providing a composition that is selective for one or more deposit types, including microbiological deposits without the use of an antigen or an antibody; (c) applying said composition to the top side of said QCM surface; (d) measuring the rate of deposition of said deposits from the aqueous medium onto the top side of said QCM surface; and (e) optionally taking corrective action to change one or more process parameters, or chemistry applied to the process, or a combination thereof, to achieve a desired result in regards to microbiological deposition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile