The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2012
Filed:
Mar. 10, 2009
Bhaskar T. Ramakrishnan, Wilsonville, OR (US);
Andrew S. Yeh, Portland, OR (US);
Mary Lynne Morrow, Molalla, OR (US);
Ernest I. Esplin, Sheridan, OR (US);
Pieter John Ganzer, Beaverton, OR (US);
John Albert Wright, Molalla, OR (US);
Brent Edward Fleming, Aloha, OR (US);
Bhaskar T. Ramakrishnan, Wilsonville, OR (US);
Andrew S. Yeh, Portland, OR (US);
Mary Lynne Morrow, Molalla, OR (US);
Ernest I. Esplin, Sheridan, OR (US);
Pieter John Ganzer, Beaverton, OR (US);
John Albert Wright, Molalla, OR (US);
Brent Edward Fleming, Aloha, OR (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A system evaluates image quality in an image generating system in a manner that accounts for the interaction of the calibration tools used to evaluate and correct image quality in the image generating system. The system includes a test pattern generator configured to generate an image with an image generating system, an image capture device configured to generate a digital signal corresponding to the generated test pattern, an image evaluator configured to process the digital signal to detect and correct anomalies detected in the generated test pattern, a plurality of calibration tools, each calibration tool being comprised of at least one test pattern, at least one set of detection criteria, and at least one set of anomaly correction parameters, and a controller configured to select the calibration tools for operation of the test pattern generator and the image evaluator in accordance with a predetermined sequence that attenuates changes arising from application of correction parameters of one calibration tool upon a later selected calibration tool.