The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2012

Filed:

Jun. 10, 2009
Applicants:

Kock-yee Law, Penfield, NY (US);

Grazyna E. Kmiecik-lawrynowicz, Fairport, NY (US);

Weiqiang Ding, Potsdam, NY (US);

Cetin Cetinkaya, Potsdam, NY (US);

Inventors:

Kock-Yee Law, Penfield, NY (US);

Grazyna E. Kmiecik-Lawrynowicz, Fairport, NY (US);

Weiqiang Ding, Potsdam, NY (US);

Cetin Cetinkaya, Potsdam, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 21/08 (2006.01); G01N 17/00 (2006.01); G01N 3/56 (2006.01); G01N 19/02 (2006.01); G03G 15/08 (2006.01); G03G 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method and device for measuring toner performance by randomly applying a toner sample having toner particles to a substrate, and positioning the substrate such that a force may be applied to individual particles of the measuring toner. A rolling resistance or rotation of the individual particles of the measuring toner is measured. The measurements may be analyzed to determine adhesion and distribution properties of individual toner particles of the measuring toner sample.


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