The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2012
Filed:
Apr. 09, 2010
Shaoming Wu, Thousand Oaks, CA (US);
Richard Wu, Thousand Oaks, CA (US);
Shaoming Wu, Thousand Oaks, CA (US);
Richard Wu, Thousand Oaks, CA (US);
Other;
Abstract
A testing machine includes a stand and a test device. The stand includes a base, box frame, a slide device driven to slide by a motor, and a control system controls the force applied on the test specimen. The test device is coupled at the slide device for performing various hardness tests consisting of Rockwell hardness test, Vickers hardness test, Brinell hardness test, micro-hardness test, and tension-compression test. The test device includes a force sensor and a data processing circuit converting an analog signal of the force sensor into digital data to interface with the control system.