The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Aug. 14, 2009
Siu-hung Fred AU, Fremont, CA (US);
Gregory Burd, San Jose, CA (US);
Zining Wu, Los Altos, CA (US);
Jun Xu, Sunnyvale, CA (US);
Ichiro Kikuchi, Yokohama, JP;
Tony Yoon, San Jose, CA (US);
Siu-Hung Fred Au, Fremont, CA (US);
Gregory Burd, San Jose, CA (US);
Zining Wu, Los Altos, CA (US);
Jun Xu, Sunnyvale, CA (US);
Ichiro Kikuchi, Yokohama, JP;
Tony Yoon, San Jose, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
Systems and methods are provided for implementing list decoding in a Reed-Solomon (RS) error-correction system. A detector can provide a decision-codeword from a channel and can also provide soft-information for the decision-codeword. The soft-information can be organized into an order of combinations of error events for list decoding. An RS decoder can employ a list decoder that uses a pipelined list decoder architecture. The list decoder can include one or more syndrome modification circuits that can compute syndromes in parallel. A long division circuit can include multiple units that operate to compute multiple quotient polynomial coefficients in parallel. The list decoder can employ iterative decoding and a validity test to generate error indicators. The iterative decoding and validity test can use the lower syndromes.