The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8132056 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 06, 2012

Filed:

Feb. 28, 2008
Applicants:

Rajesh P. Thakkar, Bangalore, IN;

John Kurian, Bangalore, IN;

Inventors:

Rajesh P. Thakkar, Bangalore, IN;

John Kurian, Bangalore, IN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and computer program product is disclosed for providing test coverage for detecting failures in a software application. The method comprises the steps of identifying a set of test cases; and for each of at least a subset of said test cases, identifying one or more of the other test cases that depend on said each of the test cases based on a defined functional relationship. The method comprises the further steps of using a selected one of said subset of test cases to test the software application; and when said test of the software application fails, then testing the software application with the one or more of the other test cases that depend on said selected one of the test cases based on said functional relationship.


Find Patent Forward Citations

Thakkar, Rajesh. (2012). Dynamic functional testing coverage based on failure dependency graph (U.S. Patent No. 8132056). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8132056

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