The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Jun. 12, 2008
Applicants:
Yulong Chen, Shenzhen, CN;
Hong Guan, Shenzhen, CN;
Gaile Lin, Shenzhen, CN;
Inventors:
Assignee:
CSR Technology Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
System and method for analyzing operation of a device under test (DUT). In one embodiment, a reference component associated with a reference device may be received. The reference device may be in communication with the DUT and a component associated with the DUT can be exchanged with the reference component. A test may be performed on the DUT, wherein a result of the test may correspond to a source of a fault associated with the DUT. An indication of the source of the fault may be provided based on the test result.