The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2012

Filed:

Feb. 23, 2005
Applicants:

Kaoru Yasukawa, Kanagawa, JP;

Kouji Adachi, Kanagawa, JP;

Kouki Uwatoko, Kanagawa, JP;

Norikazu Yamada, Kanagawa, JP;

Eigo Nakagawa, Kanagawa, JP;

Tetsuichi Satonaga, Kanagawa, JP;

Inventors:

Kaoru Yasukawa, Kanagawa, JP;

Kouji Adachi, Kanagawa, JP;

Kouki Uwatoko, Kanagawa, JP;

Norikazu Yamada, Kanagawa, JP;

Eigo Nakagawa, Kanagawa, JP;

Tetsuichi Satonaga, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A failure diagnosis method diagnoses a failure occurring in a diagnosis target apparatus including a drive mechanism having a drive member that receives power supply to operate and a power transmission member that transmits drive force of the drive member to another member. The method includes automatically acquiring by a sensor an operation state signal indicating an operation state during the drive mechanism operating for a predetermined period; and analyzing the automatically acquired operation state signal based on a failure probability model, which is obtained by modeling a cause of failure occurring in the diagnosis target apparatus with using probabilities, to execute failure diagnosis with respect to each of constituent members of the drive mechanism.


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