The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Dec. 11, 2008
David K. Asano, Easton, CT (US);
Jean-hiram Coffy, Norwalk, CT (US);
Michael P. Swenson, Danbury, CT (US);
Alexandra Mack, Monroe, CT (US);
David W. Beckstrom, Milford, CT (US);
Joan T. Doutney, Sandy Hook, CT (US);
Sarah Jurta, Fairfield, CT (US);
David K. Asano, Easton, CT (US);
Jean-Hiram Coffy, Norwalk, CT (US);
Michael P. Swenson, Danbury, CT (US);
Alexandra Mack, Monroe, CT (US);
David W. Beckstrom, Milford, CT (US);
Joan T. Doutney, Sandy Hook, CT (US);
Sarah Jurta, Fairfield, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
Systems and methods for dimensionally rating mail pieces including cards, letters, flats, mailers, packages and parcels using a pointing device such as a digital pen are described. In one illustrative configuration the system includes a digital pen, a three dimensional digital pen pattern device, a computer and a printer for printing evidence of postage payment. A mail piece such as a small parcel is placed on the opened three dimensional digital pen pattern device. The user may select a digital pen pattern command box or may otherwise engage or be prompted to begin measurements. For a rectangular parcel, the user selects a bottom right and then a top left measurement point. The system then calculates the dimensions of the parcel, dimensionally rates it and then accounts for and prints a corresponding postage indicium.