The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2012

Filed:

Dec. 20, 2007
Applicants:

Timothy P. Gibson, Overland Park, KS (US);

Jeffrey Kent Hunter, Olathe, KS (US);

Inventors:

Timothy P. Gibson, Overland Park, KS (US);

Jeffrey Kent Hunter, Olathe, KS (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for determining a received signal frequency by sampling the received signal at a rate less than twice a predefined nyquist rate. The system includes a distorting component configured to distort the received signal in a frequency dependent manner, at least one analog to digital converter configured to sample the received signal and the distorted signal at a rate less than twice a predefined nyquist rate, and a processing component configured to determine a frequency of the received signal based on the sampled received signal and the sampled distorted signal. The method includes distorting the received signal, sampling the received signal and the distorted signal at a rate less than twice a predefined nyquist rate, and determining a frequency of the received signal. In an embodiment, distorting includes at least one of distorting an amplitude or a group delay of the received signal.


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