The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Aug. 24, 2004
Peter Traneus Anderson, Andover, MA (US);
Peter Traneus Anderson, Andover, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
Certain embodiments of the present invention provide a system and method for improved distortion measurement and compensation. Certain embodiments include selecting a set of sources on a surface of a volume, determining mutual inductances from the set of sources on the surface, and calculating distortion from the volume using the mutual inductances from the set of sources on the surface. In an embodiment, distortion is calculated using an integral method and/or a finite element analysis. The volume may be modeled as a simplified construct, such as a ring model, a coil array with straight line segments model, a polygon model, and/or dipole array model. The model may be adjusted based on the distortion calculated from the volume. Magnetic fields may also be used to calculate distortion. In an embodiment, an object may be tracked using a distortion mapping.