The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
May. 12, 2008
Zhaohui Sun, Niskayuna, NY (US);
Ali Can, Troy, NY (US);
John Charles Janning, Cincinnati, OH (US);
Robert August Kaucic, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Joseph Manuel Portaz, Hamilton, OH (US);
Zhaohui Sun, Niskayuna, NY (US);
Ali Can, Troy, NY (US);
John Charles Janning, Cincinnati, OH (US);
Robert August Kaucic, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Joseph Manuel Portaz, Hamilton, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An anomaly detection method includes acquiring image data corresponding to nondestructive testing (NDT) of a scanned object. The NDT image data comprises at least one inspection test image of the scanned object and multiple reference images for the scanned object. The anomaly detection method further includes generating an anomaly detection model based on a statistical analysis of one or more image features in the reference images for the scanned object and identifying one or more defects in the inspection test image, based on the anomaly detection model.