The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
May. 28, 2008
Applicants:
Dan Lelescu, Morgan Hill, CA (US);
Robert Mullis, Soquel, CA (US);
Pravin Rao, San Jose, CA (US);
Kartik Venkataraman, San Jose, CA (US);
Cheng LU, Santa Clara, CA (US);
Junqing Chen, San Jose, CA (US);
Inventors:
Dan Lelescu, Morgan Hill, CA (US);
Robert Mullis, Soquel, CA (US);
Pravin Rao, San Jose, CA (US);
Kartik Venkataraman, San Jose, CA (US);
Cheng Lu, Santa Clara, CA (US);
Junqing Chen, San Jose, CA (US);
Assignee:
Aptina Imaging Corporation, George Town, KY;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus are disclosed for restoring an image captured through an extended depth-of-field lens. Preprocessed data relating to image degradation is stored and used during an image restoration process.