The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2012

Filed:

Feb. 08, 2008
Applicants:

Xiangyang Tang, Waukesha, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Fang Dong, New Berlin, WI (US);

Jiahua Fan, Waukesha, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Inventors:

Xiangyang Tang, Waukesha, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Fang Dong, New Berlin, WI (US);

Jiahua Fan, Waukesha, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for reconstructing an image using an imaging apparatus that includes a radiation source, a detector array, and a computer. The method includes performing a helical scan of an object at a selected helical pitch using the radiation source and detector array to obtain image data, and reconstructing an image of the object utilizing the computer programmed to perform a hybrid cone beam image reconstruction having ray-wise 3D weighting, wherein the weighting is dependent upon both helical pitch and z-distance.


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