The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Dec. 20, 2005
Shimman Patel, San Diego, CA (US);
Kuei-chiang Lai, Hsinchu, TW;
Seguei A. Glazko, San Diego, CA (US);
Shimman Patel, San Diego, CA (US);
Kuei-Chiang Lai, Hsinchu, TW;
Seguei A. Glazko, San Diego, CA (US);
Qualcomm Incorporated, San Diego, CA (US);
Abstract
For frequency bin error estimation, multiple hypotheses are formed for different frequency bin errors, pilot offsets, or combinations of frequency bin error and pilot offset. For each hypothesis, received symbols are extracted from the proper subbands determined by the hypothesis. In one scheme, the extracted received symbols for each hypothesis are despread with a scrambling sequence to obtain despread symbols for that hypothesis. A metric is derived for each hypothesis based on the despread symbols, e.g., by deriving a channel impulse response estimate based on the despread symbols and then deriving the metric based on the channel impulse response estimate. In another scheme, the extracted received symbols for each hypothesis are correlated, and a metric is derived based on the correlation results. For both schemes, the frequency bin error and/or the pilot offset are determined based on the metrics for all hypotheses evaluated.