The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
May. 22, 2007
Heikki Saari, Espoo, FI;
Heikki Saari, Espoo, FI;
Valtion Teknillinen Tutkimuskeskus, Espoo, FI;
Abstract
The invention relates to a spectrometer, a spectrometric method and detector, and a new use of an interferometer. The spectrometer comprises a Fabry-Perot interferometer (), to which light can be guided from the object () being investigated, in order to produce an interference image, and a detector () at which the interference image is aimed. The transmittance of the interferometer () is spectrally sliced to at least two separate wavelength bands. For its parts, the detector () is arranged to detect the interference image from at least two separate wavelength bands spatially. The detector is arranged to detect the said wavelength bands simultaneously, by exploiting the response of the image elements of the detector, calibrated as a function of the mirror gap of the interferometer, in order to detect simultaneously at least two different orders of the interference. With the aid of the invention, it is possible to implement spectrometric measurements more quickly, or to obtain more information on the object at one time.