The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2012

Filed:

May. 22, 2010
Applicant:

Takeshi Yamawaki, Tokyo, JP;

Inventor:

Takeshi Yamawaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The optical scanning apparatus has at least two scanning units Sand Swhich are arranged so as to oppose each other with a deflecting unit interposed therebetween. The scanning units include incident optical systems La and Lb that guide light beams emitted from light source unitsandto the deflecting unit, and imaging optical systems Ma and Mb that cause the light beams for scanning deflected on a deflecting surface of the deflecting unit to form images on surfacesandto be scanned. The two scanning units are configured such that the main scanning planes thereof including an optical reference axis Chave different heights from a bottom surfaceof the deflecting unit in the direction of the rotational axis of the deflecting unit.


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