The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2012

Filed:

Nov. 30, 2010
Applicants:

Seizo Suzuki, Kanagawa, JP;

Yoshinori Hayashi, Kanagawa, JP;

Kazuyuki Shimada, Tokyo, JP;

Inventors:

Seizo Suzuki, Kanagawa, JP;

Yoshinori Hayashi, Kanagawa, JP;

Kazuyuki Shimada, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/447 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanner includes a light source modulated based on image data, an optical deflection and scanning part deflecting a light beam emitted from the light source, and a scanning and imaging optical system condensing the deflected light beam toward a scanning surface so as to form a light spot optically scanning the scanning surface. The effective scanning region of the scanning surface is divided into a plurality of regions according to a scanning line curving characteristic. Suitable image data for optically scanning the divided regions are selected from image data of a plurality of image lines every time the light spot optically scans the effective scanning region, so that the image data of each of the image lines is written with scanning line curving being corrected.


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