The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2012

Filed:

Apr. 04, 2008
Applicants:

OH IN Kwon, Seoul, KR;

Eung Je Woo, Seongnam-si, KR;

Chun Jae Park, Seoul, KR;

Hyun Soo Nam, Seoul, KR;

Inventors:

Oh In Kwon, Seoul, KR;

Eung Je Woo, Seongnam-si, KR;

Chun Jae Park, Seoul, KR;

Hyun Soo Nam, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for imaging a shear modulus within a body is disclosed. A method for imaging a shear modulus in accordance with the present invention includes generating an elastic wave inside an object to be measured; detecting the elastic wave ongoing inside the object to be measured; calculating a shear modulus of the inside of the object to be measured, based on a value obtained by differentiating the detected elastic wave one time; and imaging the inside of the object to be measured, based on the calculated shear modulus.


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