The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Dec. 17, 2008
Applicant:
Anthony Y. Van Heugten, Sarasota, FL (US);
Inventor:
Anthony Y. Van Heugten, Sarasota, FL (US);
Assignee:
WF Systems LLC, Roanoke, VA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Axial distances between ocular structures can be measured by focusing an optical unit on focus planes corresponding to the ocular structures and using the distance between focus planes to determine the distance between the ocular structures. The method is particularly useful during eye surgery, e.g., cataract surgery, where the distance between ocular structures, particularly an aphakic pupil, can be used to more accurately predict the effective lens position for an intraocular lens.