The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8127212 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 28, 2012

Filed:

Sep. 26, 2007
Applicants:

John Johnson Wylie, San Francisco, CA (US);

Ram Swaminathan, Cupertino, CA (US);

Inventors:

John Johnson Wylie, San Francisco, CA (US);

Ram Swaminathan, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a fault tolerance of an erasure code includes deriving base erasure patterns from a generator matrix of an erasure code, determining which of the base erasure patterns are adjacent to one another and XORing the adjacent base erasure patterns with one another to produce child erasure patterns of the erasure code. The method further includes combining the base erasure patterns and the child erasure patterns to form a minimal erasures list (MEL) for the erasure code, whereby the MEL corresponds to the fault tolerance of the erasure code. Also provided are methods for communicating and storing data by using the fault tolerance of erasure codes.


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