The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Aug. 09, 2004
Bruce E. Aldridge, Oceanside, CA (US);
Rangarajan S. Thirumpoondi, Irvine, CA (US);
Bruce E. Aldridge, Oceanside, CA (US);
Rangarajan S. Thirumpoondi, Irvine, CA (US);
Teradata US, Inc., Dayton, OH (US);
Abstract
A method of systematically applying parameter evaluation techniques to large numbers of complex segmented models used for managing and analyzing a segmented manufacturing or supply chain process. These models include a plurality of segment models, each segment model representing a process segment within the segmented manufacturing or supply chain process and comprising a mathematical expression including at least one parameter. The method compares predicted values generated by a segment model with actual observed values to determining a score representative of the performance of the segment model. New parameters for the mathematical equation associated with the segment model are determined through statistical techniques when the model score indicates an unacceptable performance of the segment model. The segment models may be evaluated and updated in parallel and without manual intervention.