The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Jun. 13, 2007
Holger Heuermann, Stolberg-Breining, DE;
Holger Heuermann, Stolberg-Breining, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for calibrating vectorial network analyzers, which provide exactly n test ports, for the testing of electrical components with differential connections, where several calibration measurements are implemented, and where several different calibration standards are connected to the test ports. In the method, n is a positive integer greater than 1, and exactly one arbitrary test port is used as a reference test port. The following measurements are implemented for the calibration: (n−1) calibration measurements, where the reference test port is connected to every further test port respectively in its own calibration measurement by direct connections or short matched lines of known reflection, length and attenuation, one calibration measurement where all n test ports are terminated by respectively known input impedances of arbitrary transmission properties, and one calibration measurement where all n test ports are terminated by unknown, respectively-identical, reflecting terminations.