The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Aug. 24, 2007
Kiyoshi Nonomura, Toyota, JP;
Jiro Iwaya, Kakogawa, JP;
Takayuki Yamano, Kakogawa, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota-shi, JP;
Kabushiki Kaisha Kobe Seiko Sho, Kobe-shi, JP;
Abstract
Provided is a method for rapidly, surely, and easily identifying a factor of a shape defect of an artifact attributed to elastic recovery of deformation upon molding by using the numeric value simulation technique, thereby eliminating lowering of dimension accuracy. The method includes a step of calculating a stress distribution and distortion distribution working on an artifact before elastic recovery; a step of calculating a deformation amount δ0 based on the elastic recovery of an evaluation point when the stress distribution is given to the artifact shape before the elastic recovery; a step of dividing the artifact shape into a plurality of regions and calculating a deformation amount δn based on the elastic recovery of the evaluation point when the stress distribution is given to each of the regions of the artifact shape before the elastic recovery; and a step of comparing the deformation amount δ0 and the deformation amount δn and identifying a region where the difference between them is minimum as a main affect region, i.e., a stress distribution region which most affects the shape defect of the evaluation point before and after the elastic recovery.