The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Jan. 08, 2009
Stephen W. Farrer, Albuquerque, NM (US);
James Copland, Albuquerque, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
Wei Xiong, Albuquerque, NM (US);
Stephen W. Farrer, Albuquerque, NM (US);
James Copland, Albuquerque, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
Wei Xiong, Albuquerque, NM (US);
AMO Wavefront Sciences, LLC, Santa Ana, CA (US);
Abstract
A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.