The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Nov. 22, 2006
Applicants:

John V. Skinner, New Berlin, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Saad Ahmed Sirohey, Pewaukee, WI (US);

Sandeep Dutta, Waukesha, WI (US);

Patricia Le Nezet, Le Pecq, FR;

Deann Marie Haas, Port Washington, WI (US);

Inventors:

John V. Skinner, New Berlin, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Saad Ahmed Sirohey, Pewaukee, WI (US);

Sandeep Dutta, Waukesha, WI (US);

Patricia Le Nezet, Le Pecq, FR;

Deann Marie Haas, Port Washington, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for processing computed tomography (CT) datasets comprises identifying regions of interest (ROIs) within a CT dataset is provided. The ROIs are ranked based on a comparison to at least one predetermined parameter. The ranking determines a level of importance for the ROIs with respect to each other. A list of the ROIs is provided on a display, the list indicating the ROIs based on an associated level of importance. The ROIs are selectable with a user interface.


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